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Castellano

FA3 - New Materials Group

 

Images of some experimental set-ups

 

 
Direct access to the following characterization equipment of the C.A.C.T.I.:

TOF-SIMS

XPS







Interferometric Profiler
AFM






FTIR

XRD







HR-Raman (488, 532, 633, 785 nm)
FIB





HR-SEM
HR-TEM






SEM
TEM






Ellipsometer
Nanoindenter






Sample preparation







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last updated: 07-04-2013(newmaterials@uvigo.es)